Dixson, John A.: search on Z-Library

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1

Scanning probe microscope dimensional metrology at NIST

Kramar, John A, Dixson, Ronald, Orji, Ndubuisi G

Journal:

Measurement Science and Technology

Year:

2011

Language:

english

File:

PDF, 1.33 MB

english, 2011

2

Transmission electron microscope calibration methods for critical dimension standards

Orji, Ndubuisi G., Dixson, Ronald G., Garcia-Gutierrez, Domingo I., Bunday, Benjamin D., Bishop, Michael, Cresswell, Michael W., Allen, Richard A., Allgair, John A.

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2016

Language:

english

File:

PDF, 2.71 MB

english, 2016

3

Effects of ejaculation on levels of testosterone, cortisol, and luteinizing hormone in peripheral plasma of rhesus monkeys.

Phoenix, Charles H., Dixson, Alan F., Resko, John A.

Journal:

Journal of Comparative and Physiological Psychology

Year:

1977

Language:

english

File:

PDF, 656 KB

english, 1977

4

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2008)] Metrology, Inspection, and Process Control for Microlithography XXII - Traceable calibration of AFM step height measurements for integrated circuit manufacturing

Robert, James, Allgair, John A., Raymond, Christopher J., Banke, Bill, Dixson, Ronald, Strocchia-Rivera, Carlos

Year:

2008

Language:

english

File:

PDF, 353 KB

english, 2008

5

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Metrology, Inspection, and Process Control for Microlithography XVIII - Determination of optimal parameters for CD-SEM measurement of line-edge roughness

Bunday, Benjamin D., Bishop, Michael, McCormack, Jr., Donald W., Villarrubia, John S., Vladar, Andras E., Dixson, Ronald, Vorburger, Theodore V., Orji, N. G., Allgair, John A., Silver, Richard M.

Year:

2004

Language:

english

File:

PDF, 509 KB

english, 2004

6

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 21 February 2010)] Metrology, Inspection, and Process Control for Microlithography XXIV - Proximity-associated errors in contour metrology

Villarrubia, John S., Raymond, Christopher J., Dixson, Ronald G., Vladár, András E.

Year:

2010

Language:

english

File:

PDF, 1.30 MB

english, 2010

7

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 27 February 2011)] Metrology, Inspection, and Process Control for Microlithography XXV - TSOM method for semiconductor metrology

Attota, Ravikiran, Dixson, Ronald G., Kramar, John A., Potzick, James E., Vladár, András E., Bunday, Benjamin, Novak, Erik, Rudack, Andrew, Raymond, Christopher J.

Year:

2011

Language:

english

File:

PDF, 3.17 MB

english, 2011

8

SPIE Proceedings [SPIE Microlithography '99 - Santa Clara, CA (Sunday 14 March 1999)] Metrology, Inspection, and Process Control for Microlithography XIII - Intercomparison of SEM, AFM, and electrical linewidths

Villarrubia, John S., Dixson, Ronald G., Jones, Samuel N., Lowney, Jeremiah R., Postek, Jr., Michael T., Allen, Richard A., Cresswell, Michael W., Singh, Bhanwar

Year:

1999

Language:

english

File:

PDF, 3.27 MB

english, 1999

9

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Image simulation and surface reconstruction of undercut features in atomic force microscopy

Qian, Xiaoping, Archie, Chas N., Villarrubia, John, Tian, Fenglei, Dixson, Ronald

Year:

2007

Language:

english

File:

PDF, 740 KB

english, 2007

10

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 24 February 2008)] Metrology, Inspection, and Process Control for Microlithography XXII - Angle resolved optical metrology

Silver, R. M., Barnes, B. M., Heckert, A., Attota, R., Dixson, R., Jun, J., Allgair, John A., Raymond, Christopher J.

Year:

2008

Language:

english

File:

PDF, 1.04 MB

english, 2008

11

N-Substituted sulfonamide carbonic anhydrase inhibitors with topical effects on intraocular pressure

Duffel, Michael W., Ing, I. Silwai, Segarra, Tyrone M., Dixson, John A., Barfknecht, Charles F., Schoenwald, Ronald D.

Journal:

Journal of Medicinal Chemistry

Year:

1986

Language:

english

File:

PDF, 895 KB

english, 1986

12

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 22 February 2009)] Metrology, Inspection, and Process Control for Microlithography XXIII - Reference metrology in a research fab: the NIST clean calibrations thrust

Dixson, Ronald, Allgair, John A., Raymond, Christopher J., Fu, Joe, Orji, Ndubuisi, Renegar, Thomas, Zheng, Alan, Vorburger, Theodore, Hilton, Al, Cangemi, Marc, Chen, Lei, Hernandez, Mike, Hajdaj, Ru

Year:

2009

Language:

english

File:

PDF, 603 KB

english, 2009

13

Synthesis and activity optimization of herbicidal substituted 4-aryl-1,2,4-triazole-5(1H)-thiones

Simmons, Kirk A., Dixson, John A., Halling, Blaik P., Plummer, Ernest L., Plummer, Marjorie J., Tymonko, John M., Schmidt, Robert J., Wyle, Mike J., Webster, Charles A., et al., .

Journal:

Journal of Agricultural and Food Chemistry

Year:

1992

Language:

english

File:

PDF, 1.10 MB

english, 1992

14

Topical carbonic anhydrase inhibitors

Schoenwald, Ronald D., Eller, Mark G., Dixson, John A., Barfknecht, Charles F.

Journal:

Journal of Medicinal Chemistry

Year:

1984

Language:

english

File:

PDF, 391 KB

english, 1984

15

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, CA (Sunday 22 February 2009)] Metrology, Inspection, and Process Control for Microlithography XXIII - Improving optical measurement accuracy using multi-technique nested uncertainties

Silver, R. M., Zhang, N. F., Barnes, B. M., Zhou, H., Heckert, A., Dixson, R., Germer, T. A., Bunday, B., Allgair, John A., Raymond, Christopher J.

Year:

2009

Language:

english

File:

PDF, 1.32 MB

english, 2009

16

Validation and Comparison of the Therapeutic Efficacy of Boron Neutron Capture Therapy Mediated By Boron-Rich Liposomes in Multiple Murine Tumor Models

Maitz, Charles A, Khan, Aslam A, Kueffer, Peter J, Brockman, John D, Dixson, Jonathan, Jalisatgi, Satish S, Nigg, David W, Everett, Thomas A, Hawthorne, M Frederick

Journal:

Translational Oncology

Year:

2017

Language:

english

File:

PDF, 536 KB

english, 2017

17

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - TEM calibration methods for critical dimension standards

Orji, Ndubuisi G., Dixson, Ronald G., Garcia-Gutierrez, Domingo I., Bunday, Benjamin D., Bishop, Michael, Cresswell, Michael W., Allen, Richard A., Allgair, John A., Archie, Chas N.

Year:

2007

Language:

english

File:

PDF, 677 KB

english, 2007

18

SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, CA (Sunday 2 August 2009)] Instrumentation, Metrology, and Standards for Nanomanufacturing III - Measurement traceability and quality assurance in a nanomanufacturing environment

Orji, N. George, Postek, Michael T., Allgair, John A., Dixson, Ronald G., Cordes, Aaron, Bunday, Benjamin D., Allgair, John A.

Year:

2009

Language:

english

File:

PDF, 641 KB

english, 2009

19

Whatever the Weather: Ambient Temperature Does Not Influence the Proportion of Males Born in New Zealand

Dixson, Barnaby J., Haywood, John, Lester, Philip J., Ormsby, Diane K., Helle, Samuli

Journal:

Year:

2011

Language:

english

File:

PDF, 517 KB

english, 2011

20

Effects of Diet and Exercise on Peripheral Vascular Disease

Hall, John A., Dixson, Gerald H., Barnard, R. James, Pritikin, Nathan

Journal:

The Physician and Sportsmedicine

Year:

1982

Language:

english

File:

PDF, 1.07 MB

english, 1982

21

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Progress on implementation of a CD-AFM-based reference measurement system

Orji, Ndubuisi G., Archie, Chas N., Martinez, Angela, Dixson, Ronald G., Allgair, John

Year:

2006

Language:

english

File:

PDF, 441 KB

english, 2006

22

Advanced metrology needs for nanoelectronics lithography

Stephen Knight, Ronald Dixson, Ronald L. Jones, Eric K. Lin, Ndubuisi G. Orji, R. Silver, John S. Villarrubia, András E. Vladár, Wen-li Wu

Journal:

Comptes Rendus Physique

Year:

2006

File:

PDF, 987 KB

2006

23

Reviews

Dixson, M., Blainey, Geoffrey, Martin, A. W., Legge, J. D., Pike, Douglas, Burroughs, Peter, Robson, L. L., Bodi, L., O'Farrell, P. J., Austin, A. G., Ward, Russel, Barry, John V., O'Neill, Robert, Co

Journal:

Historical Studies

Year:

1969

Language:

english

File:

PDF, 3.09 MB

english, 1969

24

SPIE Proceedings [SPIE SPIE's 1995 Symposium on Microlithography - Santa Clara, CA (Sunday 19 February 1995)] Integrated Circuit Metrology, Inspection, and Process Control IX - Progress on accurate metrology of pitch, height, roughness, and width artifacts using an atomic force microscope

Schneir, Jason, McWaid, Thomas H., Dixson, Ronald G., Tsai, Vincent W., Villarrubia, John S., Williams, Ellen D., Fu, E., Bennett, Marylyn H.

Year:

1995

Language:

english

File:

PDF, 725 KB

english, 1995

25

The relationship between perimenstrual depressive mood and depressive illness

Pamela Warner, John Bancroft, Amanda Dixson, Michele Hampson

Journal:

Journal of Affective Disorders

Year:

1991

Language:

english

File:

PDF, 1.46 MB

english, 1991

26

Orthogonal ligation: a three piece assembly of a PNA–peptide–PNA conjugate

Burlina, Fabienne, Dixson, David D., Doyle, Robert P., Chassaing, Gérard, Boddy, Christopher N., Dawson, Philip, Offer, John

Journal:

Chemical Communications

Year:

2008

Language:

english

File:

PDF, 627 KB

english, 2008

27

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2008)] Metrology, Inspection, and Process Control for Microlithography XXII - Toward accurate feature shape metrology

Orji, Ndubuisi G., Allgair, John A., Raymond, Christopher J., Dixson, Ronald G., Bunday, Benjamin D., Allgair, John A.

Year:

2008

Language:

english

File:

PDF, 369 KB

english, 2008

28

SPIE Proceedings [SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 10 August 2008)] Instrumentation, Metrology, and Standards for Nanomanufacturing II - Accuracy considerations for critical dimension semiconductor metrology

Orji, N. G., Postek, Michael T., Allgair, John A., Dixson, R. G., Bunday, B. D., Allgair, J. A.

Year:

2008

Language:

english

File:

PDF, 574 KB

english, 2008

29

Initial Investigations of Hops as a Salmonid Egg Fungicide

Barnes, Joseph M., Dupont, Taylor R., Barnes, Michael E., Durben, Dan J., Dixson, John A.

Journal:

North American Journal of Aquaculture

Year:

2012

Language:

english

File:

PDF, 123 KB

english, 2012

30

Ambient temperature variation does not influence regional proportion of human male births in New Zealand

Dixson, Barnaby J, Haywood, John, Lester, Philip J, Ormsby, Diane K

Journal:

Journal of the Royal Society of New Zealand

Year:

2013

Language:

english

File:

PDF, 286 KB

english, 2013

31

Feeling the Heat? Substantial Variation in Temperatures Does Not Affect the Proportion of Males Born in Australia

Barnaby J. Dixson, John Haywood, Philip J. Lester and Diane K. Ormsby

Journal:

Year:

2013

Language:

english

File:

PDF, 360 KB

english, 2013

32

[IEEE 2007 IEEE International Conference on Microelectronic Test Structures - Bunkyo-ku, Japan (2007.03.19-2007.03.22)] 2007 IEEE International Conference on Microelectronic Test Structures - A Systematic Approach to Accurate Evaluation of CD-Metrology Tools

Orji, Ndubuisi G., Bunday, Benjamin D., Dixson, Ronald G., Allgair, John A.

Year:

2007

Language:

english

File:

PDF, 4.12 MB

english, 2007

33

A Multicomponent UV Analysis of α- and β-Acids in Hops

Egts, Haley, Durben, Dan J., Dixson, John A., Zehfus, Micheal H.

Journal:

Journal of Chemical Education

Year:

2012

Language:

english

File:

PDF, 1.89 MB

english, 2012

34

Developing physical property-based rules which govern the greenhouse activity of herbicidal 4-aryl-1,2,4-triazole-5(1H)-thiones

Simmons, Kirk A., Dixson, John A., Halling, Blaik P., Plummer, Ernest L., Plummer, Marjorie J., Tymonko, John M., Schmidt, Robert J., Wyle, Mike J., Webster, Charles A., et al., .

Journal:

Journal of Agricultural and Food Chemistry

Year:

1992

Language:

english

File:

PDF, 754 KB

english, 1992

35

Reference models for digital libraries: actors and roles

José Borbinha, John Kunze, Angela Spinazzè, Peter Mutschke, Hans-Jörg Lieder, Michael Mabe, Larry Dixson, Howard Besser, Becky Dean, Warwick Cathro

Journal:

International Journal on Digital Libraries

Year:

2005

Language:

english

File:

PDF, 496 KB

english, 2005

36

Feeling the Heat? Substantial Variation in Temperatures Does Not Affect the Proportion of Males Born in Australia

Dixson, Barnaby J., Haywood, John, Lester, Philip J., Ormsby, Diane K.

Journal:

Year:

2013

Language:

english

File:

PDF, 264 KB

english, 2013

37

SPIE Proceedings [SPIE Astronomical Telescopes and Instrumentation - Orlando, FL (Wednesday 24 May 2006)] Space Telescopes and Instrumentation I: Optical, Infrared, and Millimeter - The JWST infrared Scanning Shack Hartman System: a new in-process way to measure large mirrors during optical fabrication at Tinsley

Kiikka, Craig, Neal, Daniel R., Kincade, John, Bernier, Robert, Hull, Tony, Chaney, David, Farrer, Steve, Dixson, John, Causey, Avery, Strohl, Steve, Mather, John C., MacEwen, Howard A., de Graauw, Ma

Year:

2006

Language:

english

File:

PDF, 1.96 MB

english, 2006

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